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Languages: French
Types: Article
Subjects: Environnement spatial, Rayonnements ionisants, Dose cumulée, Débit de dose, Bipolaire, BiCMOS, Assurance-qualité, 621, Spaœ environment, Ionizing radiations, Total dose, Dose rate, Bipolar, Hardness-assuranoe
Reproduire les dégradations accrues des technologies bipolaires/BiCMOS, dues aux faibles débits de dose de radiations ionisantes propres à l'environnement spatial, est un problème non encore résolu. Plusieurs démarches expérimentales, faisant appel à des facteurs tels la température et la polarisation des composants et circuits, ont été explorées. Elles ont permis de s'approcher d'un niveau de dégradation réaliste. Grâce aux résultats obtenus, les principes d'une adaptation des méthodes de test actuelles ont pu être proposés. Des analyses technologiques de composants sont venues compléter ce travail afin d'améliorer la compréhension des phénomènes mis en jeu et d'affiner la recherche de solutions. The low dose rate enhamed sensitivity (ELDRS), due to ionizing radiations in space environment, affects most of the bipolar and BiCMOS technologies. Reproducing this phenomenon, with the laboratory typical high dose rates, is a hard challenge. In order to do so, several experimental ways, based on parameters such as temperature and bias, have been investigated in these works. Some pretty realistic degradation levels have been reached and we propose an experimental approach that could improve the existing hardness assurance methodologies. Technical analysis of some of the studied parts were also performed to improve the understanding of the mechanisms involved.
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