LOGIN TO YOUR ACCOUNT

Username
Password
Remember Me
Or use your Academic/Social account:

CREATE AN ACCOUNT

Or use your Academic/Social account:

Congratulations!

You have just completed your registration at OpenAire.

Before you can login to the site, you will need to activate your account. An e-mail will be sent to you with the proper instructions.

Important!

Please note that this site is currently undergoing Beta testing.
Any new content you create is not guaranteed to be present to the final version of the site upon release.

Thank you for your patience,
OpenAire Dev Team.

Close This Message

CREATE AN ACCOUNT

Name:
Username:
Password:
Verify Password:
E-mail:
Verify E-mail:
*All Fields Are Required.
Please Verify You Are Human:
fbtwitterlinkedinvimeoflicker grey 14rssslideshare1
Cheung, CS; Liang, H (2013)
Publisher: SPIE
Languages: English
Types: Article
Subjects:
While OCT has been applied to the non-invasive examination of the stratigraphy of paint layers in recent years, it has been recognized that the resolutions of commercially available OCT cannot compete in depth resolution with conventional microscopic examination of cross-sections of paint samples. It is necessary to achieve resolutions better than 3 microns to resolve the thinnest layers of paint and varnish. In this paper, we demonstrate a Fourier domain ultrahigh resolution OCT at 810nm with depth resolution of 1.8μm in air (or 1.2μm in varnish or paint).

Share - Bookmark

Cite this article