LOGIN TO YOUR ACCOUNT

Username
Password
Remember Me
Or use your Academic/Social account:

CREATE AN ACCOUNT

Or use your Academic/Social account:

Congratulations!

You have just completed your registration at OpenAire.

Before you can login to the site, you will need to activate your account. An e-mail will be sent to you with the proper instructions.

Important!

Please note that this site is currently undergoing Beta testing.
Any new content you create is not guaranteed to be present to the final version of the site upon release.

Thank you for your patience,
OpenAire Dev Team.

Close This Message

CREATE AN ACCOUNT

Name:
Username:
Password:
Verify Password:
E-mail:
Verify E-mail:
*All Fields Are Required.
Please Verify You Are Human:
fbtwitterlinkedinvimeoflicker grey 14rssslideshare1
Publisher: Wiley - V C H Verlag GmbH & Co.
Languages: English
Types: Article
Subjects: TK
The ferromagnetic material MnSb can exist in two polymorphs in epitaxial thin-film form, namely niccolite n-MnSb and cubic c-MnSb. We investigate the behavior of these polymorphs using grazing incidence depth-dependent in-plane X-ray diffraction. The in-plane lattice parameter evolution of a nominal 3000 Å thin film reveals a small near-surface compression of math formula0.1% in the majority n-MnSb component. A similar effect is also observed for the cubic polymorph, suggesting that the local strain environment of these crystallites is dominated by the n-MnSb matrix.
  • The results below are discovered through our pilot algorithms. Let us know how we are doing!

    • [1] W. V. Roy, J. D. Boeck, B. Brijs, and G. Borghs, Appl. Phys. Lett. 77(25), 4190-4192 (2000).
    • [2] P. Bach, A. S. Bader, C. Ruster, C. Gould, C. R. Becker, G. Schmidt, L. W. Molenkamp, W. Weigand, C. Kumpf, E. Umbach, R. Urban, G. Woltersdorf, and B. Heinrich, Appl. Phys. Lett. 83(3), 521-523 (2003).
    • [3] B. Kuerbanjiang, Z. Nedelkoski, D. Kepaptsoglou, A. Ghasemi, S. E. Glover, S. Yamada, T. Saerbeck, Q. M. Ramasse, P. J. Hasnip, T. P. A. Hase, G. R. Bell, K. Hamaya, A. Hirohata, and V. K. Lazarov, Appl. Phys. Lett. 108, 172412 (2016); http://dx.doi.org/10.1063/1.4948466.
    • [4] M. Kawano, S. Yamada, S. Oki, K. Tanikawa, M. Miyao, and K. Hamaya, Jpn. J. Appl. Phys. 52(4S), 04CM06 (2013).
    • [5] S. Yamada, K. Tanikawa, S. Oki, M. Kawano, M. Miyao, and K. Hamaya, Appl. Phys. Lett. 105, 071601 (2014)
    • [6] S. Liu, S. M. Bedair, and N. A. El-Masry, Mater. Lett. 42(1-2), 121-129 (2000).
    • [7] H. Tatsuoka, H. Kuwabara, M. Oshita, T. Nakamura, H. Fujiyasu, and Y. Nakanishi, Thin Solid Films 281-282, 499-502 (1996).
    • [8] S. Hatfield and G. R. Bell, Surf. Sci. 601(23), 5368-5377 (2007).
    • [9] J. D. Aldous, C. W. Burrows, I. Maskery, M. Brewer, D. Pickup, M. Walker, J. Mudd, T. P. A. Hase, J. A. Duffy, S. Wilkins, C. Sa´nchez-Hanke, and G. R. Bell, J. Cryst. Growth 357, 1-8 (2012).
    • [10] C. W. Burrows, A. Dobbie, M. Myronov, T. P. A. Hase, S. B. Wilkins, M. Walker, J. J. Mudd, I. Maskery, M. R. Lees, C. F. McConville, D. R. Leadley, and G. R. Bell, Cryst. Growth Des. 13(11), 4923-4929 (2013).
    • [11] Y. Q. Xu, B. G. Liu, and D. G. Pettifor, Physica B 329, 1117 (2002).
    • [12] J. D. Aldous, C. W. Burrows, A. M. Sa´nchez, R. Beanland, I. Maskery, M. K. Bradley, M. dos Santos Dias, J. B. Staunton, and G. R. Bell, Phys. Rev. B 85, 060403(R) (2012).
    • [13] S. D. Guo and B. G. Liu, EPL 93, 47006 (2011).
    • [14] T. Hanna, D. Yoshida, and H. Munekata, J. Cryst. Growth 323(1), 383-386 (2011).
    • [15] W. Terui, H. Munekata, T. Hanna, and D. Yoshida, Phys. Status Solidi C 8(2), 396-398 (2011).
    • [16] T. Amemiya, Y. Ogawa, H. Shimizu, H. Munekata, and Y. Nakano, Appl. Phys. Express 1(2), 022002 (2008).
    • [17] H. Kum, S. Jahangir, D. Basu, D. Saha, and P. Bhattacharya, Appl. Phys. Lett. 99, 152503 (2011).
    • [18] E. D. Fraser, S. Hegde, L. Schweidenback, A. H. Russ, A. Petrou, H. Luo, and G. Kioseoglou, Appl. Phys. Lett. 97, 041103 (2010).
    • [19] D. Basu, D. Saha, C. C. Wu, M. Holub, Z. Mi, and P. Bhattacharya, Appl. Phys. Lett. 92, 091119 (2008).
    • [20] G. R. Bell, C. W. Burrows, T. P. A. Hase, M. J. Ashwin, S. R. C. McMitchell, A. M. Sanchez, and J. D. Aldous, SPIN 04, 1440025 (2014).
    • [21] B. T. M. Willis and H. P. Rooksby, Proc. Phys. Soc. B 67(4), 290 (1954).
    • [22] J. D. Aldous, C. W. Burrows, I. Maskery, M. S. Brewer, T. P. A. Hase, J. A. Duffy, M. R. Lees, C. Sa´nchez-Hanke, T. Decoster, W. Theis, A. Quesada, A. K. Schmid, and G. R. Bell, J. Phys.: Condens. Matter 14, 146002 (2012).
    • [23] B. K. Tanner, T. P. A. Hase, T. A. Lafford, and M. S. Goorsky, Adv. X-Ray Anal. 47, 309 (2003).
    • [24] H. Dosch, B. W. Batterman, and D. C. Wack, Phys. Rev. Lett. 56(11), 1144-1147 (1986).
    • [25] S. Hatfield, J. Aldous, and G. R. Bell, Appl. Surf. Sci. 255(6), 3567-3575 (2009).
    • [26] I. G. Hughes and T. P. A. Hase, Measurements and their Uncertainties: A Practical Guide to Modern Error Analysis (Oxford University Press, Oxford, 2010).
  • No related research data.
  • No similar publications.

Share - Bookmark

Funded by projects

Cite this article