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Kartopu, Giray; Tempez, A; Clayton, Andrew J; Barrioz, Vincent; Irvine, Stuart J; Olivero, C; Chapon, P; Legendre, S; Cooper, J (2014)
Publisher: Maney Publishing
Languages: English
Types: Article
Thin film CdTe photovoltaic (PV) devices and reference layers obtained by the atmospheric pressure metalorganic vapour deposition (AP-MOCVD) method have been studied for their chemical structure using plasma profiling time-of-flight-mass spectroscopy (PP-TOFMS, also called glow discharge TOFMS). Different levels of arsenic (As) dopant in CdTe films were measured by PP-TOFMS and compared to results obtained from a more conventional depth profiling method (secondary ion mass spectrometry or SIMS). This comparison showed that PPTOFMS has the sufficient sensitivity towards detection of the As dopant in CdTe and hence is suited as a rapid, low vacuum tool in controlling the large scale production of CdTe PV materials.
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    • [2] G. Kartopu, A.J. Clayton, W.S.M. Brooks, S.D. Hodgson, V. Barrioz, A. Maertens, D.A. Lamb, and S.J.C. Irvine, Effect of window layer composition in Cd1-xZnxS/CdTe solar cells, Prog. Photovolt.: Res. and Appl., 2014, 22, 18-23.
    • [3] V. Barrioz, Y.Y. Proskuryakov, E.W. Jones, J.D. Major, S.J.C. Irvine, K. Durose, and D.A. Lamb, Highly arsenic doped CdTe layers for the back contacts of CdTe solar cells, Mat. Res. Soc. Symp. Proc., 2007, 1012, Y12-08.
    • [4] A.J. Clayton, S.J.C. Irvine, D.A. Lamb, W.S.M. Brooks, S. D. Hodgson, V. Barrioz, G. Kartopu, and S. Rugen-Hankey, Aluminium doped zinc oxide haze comparison for ultra-thin Cd1-xZnxS/CdTe PV cells, Proceedings of PVSAT 9, Swansea, UK, April 2013, University of Swansea.
    • [5] T.L. Chu, S.S. Ferekides, C.Q. Wu, J. Britt, and C. Wang, 13.4% efficient thin‐film CdS/CdTe solar cells, J. Appl. Phys., 1991, 70, (12), 7608-7612; M. Tsuji, T. Aramoto, H. Ohyama, T. Hibino, and K. Omura, Characterization of CdS thin-film in high efficient CdS/CdTe solar cells, Jap. J. Appl. Phys., 2000, 39, 3902-3906.
    • [6] K. Durose, P.R. Edwards, and D.P. Halliday, Material aspects of CdS/CdTe solar cells, J. Cryst. Growth, 1999, 197, 733-742.
    • [7] S. W. Schmitt, C. Venzago, B. Hoffmann, V. Sivakov, T. Hofmann, J. Michler, S. Christiansen, and G. Gamez, Glow discharge techniques in the chemical analysis of photovoltaic materials, Prog. Photovolt: Res. Appl., 2012, DOI: 10.1002/pip.2264;
    • [8] C. Gonzales-Gago, J. Pisonero, N. Bordel, A. Sanz-Medel, N. J. Tibbets, and V. S. Smentkowski, Radiofrequency pulsed glow discharge-ToFMS depth profiling of a CdTe solar cell: A comperative study versus time of flight secondary ion mass spectroscopy, J. Vac. Sci. Technol. A, 2013, 31(6), 06F106-1-7.
    • [9] I. S. Molchan, G. E. Thompson, P. Skeldon, N. Trigoulet, A. Tempez, and P. Chapon, Analysis of thin impurity doped layers in anodic alumina and anodic tantala films by glow discharge time-of-flight mass spectrometry, T. I. Met. Finish., 2010, 88, (3), 154-157.
    • [10] R. Aninat, G. Zoppi, A.Tempez, P. Chapon, N. S.Beattie, R.Miles, and I. Forbes, Crystallographic properties and elemental migration in two-stage prepared CuIn1−xAlxSe2 thin films for photovoltaic applications, J. Alloys Compd., 2013, 566, 180-186.
    • [11] S.J.C. Irvine, V. Barrioz, D. Lamb, E.W. Jones, and R.L. Rowlands-Jones, MOCVD of thin film photovoltaic solar cells-Next-generation production technology?, J. Cryst. Growth, 2008, 310, 5198-5203.
    • [12] V. Barrioz, S. J. C. Irvine, E. W. Jones, R. L. Rowlands, and D. Lamb, In situ deposition of cadmium chloride films using MOCVD for CdTe solar cells, Thin Solid Films, 2007, 515, (15), 5808-5813.
    • [13] R. Payling, and T. Nelis, Glow Discharge Optical Emission Spectroscopy: A Practical Guide, (ed. N.W. Barneet), 2003, Cambridge, RSC Publishing.
    • [14] A. Tempez, N. Bordel, M. Hohl, L. Lobo, J.Orphal, C. Diplasu, A. Surmeian, M. Ganciu Petcu, and T. Nakamura, Ionization processes in a Grimm type source used in pulsed
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